MIL-M-38510/107C 1989_ superseding- MIL-M-38510/107B No

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INCH-POUHB~T
MIL-M-38510/107C
1989_
superseding-
MIL-M-38510/107B November 1979
MILITARY SPECIFICATION
MICROCIRCUITS, LINEAR, POSITIVE, VOLTAGE REGULATORS, MONOLITHIC SILICON
This specification approved Departments Agencies Department Defense.
Scope. This specification covers detail requirements fixed output, monol itTiTcsi icon positive voltage regulators. product assurance classes choice case outlines lead finishes provided reflected complete Part Identifying Number (PIN) (see 6.6).
Classification.
1.2.1 Device types. device types shall shown following:
Device type
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
Voltage regulator,
1.2.2 Device class.
rcui
ampere ampere ampere
Case outline letter
(see table
defined MIL-M-38510.
1.2.3 Case outlines. case outlines shall designated follows:
Case outline letter Case outline
figure
figure
Absolute maximum rating.
Input voltage:
Device types
Device types Vodc
Lead temperature (soldering, seconds)
Storage temperature -65"C
Junction temperature (Tj)
device protected thermal shutdown circuit which designed turn output transistor whenever device junction temperature excess +150,,C.
Beneficial comments (recommendations, additions, deletions) pertinent data which Improving this document should addressed Rome Development Center, AFSC, RADC/RBE-2, Grlfflss AFB, 13441-5700, using self-addressed Standardization Document Improvement Proposal Form 1426) appearing this document letter._
AMSC
DISTRIBUTION STATEMENT
5962
Approved public release; distribution unlimited.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
Recommended operating conditions.
Input voltage range:
Device type 01.+7.0
Device types 06.-.+8.0
Device types 07.+15
Device types 08._ +18.5
Device types
Ambient operating temperature range (Ta)
Thermal characteristics:
Case Maximum Maximum without heat sink Maximuml Maximum with heat sink Maxi
0.18 0.71 10oC/W
0.89 3.60 2.50 28.00
1.50 5.80 4.00 45.00
APPLICABLE DOCUMENTS Government documents.
2.1.1 Specifications, standards, handbooks. following specifications, standards, handbooks form part this document extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DODISS) supplement thereto, cited solicitation (see 6.2).
SPECIFICATION
MILITARY
MIL-M-38510 Microcircuits, General Specification for. STANDARD
MILITARY
MIL-STD-883 Test Methods Procedures Microelectronics.
(Unless otherwise indicated, copies federal military specifications, standards, handbooks available from Naval Publications Forms Center, (ATTN: NPODS), 5801 Tabor Avenue, Philadelphia, 19120-5099.)
Order precedence. event conflict between text this document references cited herein (except related associated detail specifications, specification sheets, standards), text this document takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained.
TTFTs value represents maximum allowable thermal Impedance heat sink
remain within above thermal ratings. Based specified values 6jc.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
REQUIREMENTS
Detail specifications. individual item requirements shall
accordance with MIL-M-38510, specified 1.2.3 herein.
Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-M-38510 herein.
3.2.1 Block diagram terminal connections. block diagram terminal connections shall specified figures
3.2.2 Functional schematic circuits. functional schematic circuits shall specified figure Schematic circuits shall submitted preparing activity prior inclusion manufacturer's device this specification shall submitted qualifying activity agent activity (DESC-ECS) prerequisite qualification. qualified manufacturers' schematics shall maintained agent activity will available upon request.
3.2.3 Case outlines. Case outlines shall specified 1.2.3 figures
3.2.4 Package sealing material. Package sealing material shall accordance with MIL-M-38bl0.
Lead material finish. lead material finish shall accordance with MIL-M-38510 (see 6.4) follows.
3.3.1 Lead materia
Type
Nickel -Manganese Silicon Carbon -Chromium -Cobalt -Phosporous Sulfur -Aluminum -Iron
Type
Copper core 24.75 percent, maximum
Clad with Alloy 75.25 percent, maximum
3.3.2 Lead finish. Lead finish shall accordance with MIL-M-38510 (see 6.4).
Electrical performance character!sties. electrical performance characteristics specified table apply over full recommended ambient operating temperature range, unless otherwise specified.
3.4.1 Stability. device located appreciable distance from power supply filter, large (1.0 bypass capacitor should connected close device input possible suppress oscillation. (0.1 bypass capacitor recommended device output. Output current oscillations likely occur current limit operating mode with high input voltages (VIN dc).
50-53 percent 0.60 percent, maximum 0.30 percent, maximum 0.10 percent, maximum 0.25 percent, maxi 0.50 percent, maximum 0.025 percent, maximum 0.025 percent, maximum 0.10 percent, maximum Remai nder
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
iCharacteristies Symbol (see figure Conditions unless otherwise specified) Limits Unit
Input voltage Load current Other
case case
lOutput voltage VOUT jVlN 4.70 5.40
jVIN -0.5 -1.5 4.70 5.40
IVin -0.5 4.70 5.40
|VIN -1.5 4.70 5.40
|VIN 4.70 5.40
IVIN -100 -1.0 4.70 5.40
iLine regulation VRLINE +25"C
-100
lLoad regulation vRL0AD j*IN !MAX 1-55"C -100 +100
IMAXc -0.5 *MAX -1.5 +125"C
Standby current drain ISCD <.25 -10.0 +0.5
IStandby current drain change (versus line voltage) AlSCD (line) -0.5 +0.5
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Conditions CharacteristicsiSymbol (see figure unless otherwise specified) Limits Input voltage Load current Other case case
Standby currentlAlsCD UMAX -0.8 +0.8 drain change'1(load)1 (versus load current) Umax ImAX -0.5 -1.5
Output short 2/Hos |ViN Case 1-2.0 0.011 circuit i-1-\-1-r current Case 1-2.8 0.011
Minimum iVsTARTl ICase (R|_ start-up figure input voltagel ICase
Ripple IaVjn |VIN -125 -350 rejection le-j (See IaV0UT 2,400 Ifigure
Output noise IVtm -100 voltage +25"C (See figure
Line transient .IaVqut lvIN response UVIN l(Vpulse +25"C (See figure mV/V
Load transient IaVout IVin 1-100 response |aI|_ IaIl Al|_ -200 -400 +25MC (See figure ImV/mA
Average UVouT !VIN temperature coefficient output tage +125"C1 -2.0 +2.0 lmV/"C
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Symbol (see figure Conditions unless otherwise specified) Limits Unit
Input tage Load current Other
voltage VOUT IVIM |VIN IVIM -0.5 -0.5 4.75 4.75 4.75 5.25 5.25 5.25
IVIM +150"C 4.70 5.30
Hine regulation VRLINE Vtij -350 1-150 +150
regulation vrload IVim IVim -500 1-100 1-150 +150
current drain !scd |VIN IVim -7.0 -8.0 -0.5 -0.5
iStandby current drain change (versus line voltage) iifS) -1.0
IStandby current drain change (versus load current) (load) -500 -0.5 +0.5
|Output short circuit current IVim IVim -2.00 -1.50 -1.00 -0.01 -0.01 -0.01
lOverload current IVim Iforced UVQUT -0.48 figure -2.0 -0.5
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
(Characteristics Symbol Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
Iftipple rejection AVOUT 2,400 -125 figure +25"C
lOntput noise tage figure +25"C liiV
transient response aVOUT IVIN rtlH figure +25"C mV/V
lLoad transient response aVout jvIN -200 figure +25"C mV/mA!
1Average temperature coefficient output tage aVout +125"C -55"C -2.0 mV/"C1
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Conditions (Characteristics Symbol (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
lOiitput voltage IVqut |i[_ -0.5 IVIN -0.5 |VIN 11.401 12.601 11.401 12.601 11.401 12.601
IVIN +150"C 11.281 12.721
regulationIVrlihe115 V|IL V|IL -350 -360 1+360 -120 1+120
lLoad regulation|VRL0ADIVIN 1-500 IVim 1-50 <~ll <~-5 -240 1+240 -360 +360
Standby currentUsCD 1Vtm drain |VIN -7.0 -8.0 -0.5 -0.5
iStandby currentIaIjcd drain change (Une) (versus voltage) -1.0 +1.0
IStandby currentUISCD lvIN drain change l(load)| (versus load current) -500 -0.5 +0.5
lOutput short IVin circuit IVim current IVim -1.75 -1.25 -1.00 -0.011 -0.011 -0.011
Overload ivim current Iforced UVqut -1.13 figure -2.0 -0.5
footnotes table.
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MIL-M-38510/.107C
TABLE Electrical performance characteristics device type (see 3.4), unless otherwise specified) Continued.
Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
Ripple IaVin |VIN rejection IaVout 2,400 -125 figure
Output noise IVjn voltage figure rms1 +25"C
Line transient IaVout lvin response UVIM iVpuise figure mV/V +25"C
Load transient IaVquj IVjn figure mV/mA| -200
Average IaVout lvIN tpmpprat.iirp coefficient output tage 1-3.0 +3.0 mV/"c|
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Characteristics Symbol Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
Output voltage VOUT 18.5 -0.5 -0.5 14.25 14.25 14.25 15.75 15.75 15.75
+150"c 14.10 15.90
Line regulation VRLINE 18.5 -350 -150
Load regulation vRL0AD -500 -300 -450 +300 +450
Standby current drain -7.0 -8.0 -0.5 -0.5
Standby current drain change (versus line voltage) Al$CD (line) 18.5 -1.0
Standby current drain change (versus load current) AlSCD. (load) -500 -0.5 +0.5
Output short circuit current -1.75 -1.00 -0.01 -0.01
Overload current 18-5 forced aVqut -1.43 figure -2.0 -0.5
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
i-1-1-i-1-r Conditions r.haracteristiesiSvmbol (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
Ripple IaVim |VIN rejection le-f IaVqut 2,400 -125 figure
Output noise |VIN voltage figure rmsl
Line transient IaVqut IvIN response UVin iVpulse figure mV/V +25"C
Load transient IaVqut lvin rpcnnncp IaIl figure mV/mA| -200
Average IaVqut lvin fpmppratu coefficient output tage -3.75 +3.751 mV/"C|
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
iCharacteristiesiSymbol Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
voltage IVqut -0.5 -0.5 22.80 22.80 22.80 25.20 25.20 25.20
22.56 25.44
iLine regulationIVrline V|IL V|IL -350 -720 -240 +720 +240
iLoad regulationIVrloAD 1-500 1-50 -480 -720 +480 +720
current|I$CD drain -7.0 -8.0 -0.5 -0.5
currentIaIscd drain change (versus line voltage) -1.0
current 1AIsCD drain change (versus load current) 1-500 -0.5 +0.5
|Output short circuit current -1.25 -1.00 -1.00 -0.01 -0.01 -0.01
current figure forced AVQUT -2.28 -2.0 -0.5
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Symbol (see figure Conditions unless otherwise specified) Limits Unit
Input voltage Load current Other
Ripple rejection aVIN aVouT 2,400 -125 figure
noise tage figure rms!
transient response aVouT aVin Vpulse III. figure mV/V
lLoad transient response aVouT IaIl -200 figure mV/mAl
Average temperature coefficient output tage AVouT +125'C -6.0 +6.0 mV/"C1
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
1Cha teristi 1Symbol Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
1Output voltage IVquj -1.0 -1.0 -0.1 4.75 4.75 4.75 5.25 5.25 5.25
4.70 5.30
regolationIVrline -0.1 -0.5 -150 +150
lLoad regulation iVRLOAD -1.0 -0.1 -100 -150 +100
1Standby current drain *scd Vi*, -7.0 -8.0 -0.5 -0.5
Standby current drain change (versus line voltage) -1.0 +1.0
IStandby current drain change (versus load current) (loaS) -1.0 -0.5 +0.5
1Output short circuit current IVIN |VIN jVlN -4.00 -3.00 -2.00 -0.021 -0.021 -0.021
current IVIN Iforced |AVOUT -0.48 figure -4.0 -1.0
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
iCharacteristies Symbol (see figure Conditions unless otherwise specified) Limits Unit
Input voltage Load current Other
Ripple rejection AVIM AVOUT 2,400 -350 figure
lOutput noise tage -0.1 figure rmsl
transient response aVout aVin Vpulse |I|_ figure mV/V
transient response AVOUT -100 IaIl -400 figure mV/mAl
Average temperature coefficient output tage AVouT +125"C -55*C -2.0 +2.0 mV/"C1
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Conditions CharacteristiesiSymbol1 (see figure unless otherwise specified) Limits Unit Input voltage toad current Other
Output voltage IVqut IVin -1.0 11.401 12.601 |VIN -1.0 11.401 12.601 |VIN -5mA, -0.1 11.401 12.601 jViN 11.281 12.721
Line regulationIVri rwr115 -0.1 -0.5 1-360 1+360 -120 1+120
Load regulation|Vri_oad'vIN IVIN -1.0 -0.1 -240 1+240 -360 1+360
Standby currentHsCD 'VIN drain |VIN -7.0 -0.5 -8.0 -0.5
Standby drain change Ine) (versus line voltage) -1.0 +1.0
Standby currentIaIscd 'vIN drain change 1(load) (versus load current) -1.0 -0.5 +0.5
lOutput short IVin circuit IVin current IVtii -3.501 -0.021 -2.501 -0.021 -2.001 -0.021
lOverload IVin current 1forced UVOUT -1.13 figure -4.0 -1.0
footnotes table.
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TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
rejection Conditions Svmboll (see figure unless otherwise specified) Limits unit Input voltage Load current Other aVim IVtn -350 figure aVout 2,400
Output noise voltage IVIN -0.1 figure +25"C
transient response aVout iViN |I|_ aVin Impulse figure mV/V
transient response .V0UT |VIN figure mV/mA +25*C
temperature coefficient output tage AVout IVin +125"C -3.0 +3.0 mV/"C -55"C
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Characteristics Symbol Conditions (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
Output voltage VOUT 18.5 -1.0 -1.0 -0.1 14.25 14.25 14.25 15.751 15.751 15.751
+150"C 14.10 15.901
Line regulation VRLINE 18.5 <35V~ -0.5 -150 +150
Load regulation vrload -1.0 -0.1 -300 -450 +300 +450
Standby current drain -7.0 -8.0 -0.5 -0.5
Standby current drain change (versus line voltage) AlSCD4 (line) 18.5 -1.0 +1.0
Standby current drain change (versus load current) AlSCD (load)1 -1.0 -0.5 +0.5
Output short 1Vim circuit IVin current 2/5/11 1Overload 1I0l lvIN 18-5 current jforced IAVOUT -1-43 figure -3.501 -0.021 -2.001 -0.021 -4.0 -1.0
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
Conditions Svmbol (see figure unless otherwise specified) Limits Unit
Input voltage Load current Other
rejection AVIN IVIN le-f aVqut 2,400 -350 figure
noise tage |VIN -0.1 figure +25"C
transient response aVout IVin aVin iVpulse figure mV/V
transient response aVout IVin -100 figure -400 mV/mAl
temperature coefficient output tage aVout IVin +12fC -3.751 +3.751 mV/"C
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
CharacteristicsiSymbol
Conditions
(see figure unless otherwise specified)
Input voltage
Load current
Other
Limits
Unit
Output voltage
VOUT
-1.0 -1.0 -0.1
22.80 22:80 22.80
25.20 25.20 25.20
jVlN
+150*C
22.56
25.44
Line regulation
VRLINE
-0.1 -0.5
-240
+720 +240
Load regulation
vRL0AD
-1.0 -0.1
+480 +720
Standby current drain
ISCD
-7.0 -8.0
-0.5 -0.5
Standby current drain change (versus line voltage)_
(line)
Standby current drain change (versus load current)
AlSCD (load)
-1.0
-0.5
+0.5
Output short circuit current
-2.50 -2.00
-0.02 -0.005
Overload current
forced
aVqut "2.28
figure
-4.0
-1.0
footnotes table.
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MIL-M-38510/107C
TABLE Electrical performance characteristics device type
(see 3.4), unless otherwise specified) Continued.
CharacteristiesiSymbolI Ripple IaVin rejection (see figure Input voltage 2,400 Conditions unless otherwise specified) Limits Unit Load current Other -350 figure
noise voltage -o.l figure +25"C
iLine transient IaVqut response UVIM VpuUe figure mV/V +25"C
lLoad transient IaVqut response IaIL -100 figure mV/mA -400
IaVouT tomppraturp coefficient output tage -6.0 >6.0 III!
v0UT test conducted -55"C only.
second maximum test duration.
meter shall have minimum bandwidth from shall measure true voltages.
device types through tests performed manufacturer's option, performed Specifications +125 shall then apply
capacitor added dampen oscillations during test device types through
overload current test checks device current limiting, measure output peak current.
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3.4.2 Test 1imits. test limits specified tables apply only stated test conditions (e.g., percent duty cycle), which essentially keep junction temperature constant. most applications junction temperature will greatly exceed 25"C ambient sink temperature; thus devices perform within specified limits.
Electrical test requirements. electrical test requirements shall specified table subgroups table which constitute minimum electrical test requirements screening, qualification, quality conformance device class specified table
TABLE Electrical test requirements.
MIL-STD-883 Subgroups (see table III)
test requirement Class devices devices
Interim electrical parameters (method 5004)
Final electrical test parameters (method 5004) 1*,2 ,3,4
Group test requirements (method 5005) 1,2,3,4,7,8 1,2,3 ,4,7,8
Group end-point group class electrical parameters! (method 5005) 1,2,3 table delta limits table limits
Group end-point electrical parameters (method 5005) 1,2,3
applies subgroup (see 4.3e).
Marking. Marking shall accordance with MIL-M-38510.
3.6.1 Serializatlon. class devices shall serialized accordance with MIL-M-3S510.
3.6.2 Correctness indexing marking. devices shall subjected final electrical tests specified table after part marking verify that they correctly Indexed identified PIN. Optionally, approved electrical test devised especially this requirement.
Microcircuit group assignment. devices covered this specification shall microcircuit group number (see MIL-M-38510, appendix
QUALITY ASSURANCE PROVISIONS
Sampling inspection. Sampling Inspection procedures shall accordance with MIL-M-38510 methods 5005 5007, applicable, MIL-STD-883, except modified herein.
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Qualification inspection. Qualification Inspection shall ,accordance with MlL-M-3bblO Inspections performed shall those specified herein groups inspections (see 4.4.1, 4.4.2, 4.4.3, 4.4.4).
Screening. Screening shall accordance with method 5004 MIL-STD-683, shall conducted devices prior qual flcat quality conformance Inspection. following additional criteria shall apply.
class class devices, additional burn-In screen shall
performed accordance with figure test operation thermal shutdown circuit. This screen shall performed after seriali zation (method 5004 MIL-std-883) before Interim electrical parameters (method 5004 hil-std-883). requirements 3.*.3 method 1015 MIL-std-883 shall apply this screen except devices need tested oven.
Interim electrical parameters shall performed class class devices shall specified table III.
Burn-in (method 1015 MIL-STD-883). class class devices, only test condition shall apply using circuit shown figure Accelerated test conditions shall used.
Reverse bias burn-in shall performed.
Percent defective allowable (PDA). class class devices shall specified MIL-M-38510, based failures from qroup subgroup test after cooldown final electrical test accordance with method 5004 MIL-STD-883 with intervening electrical measurements. interim electrical parameter tests performed prior burn-in, failures resulting from burn-in screening excluded from PDA. interim electrical parameter tests prior burn-in omitted, then screening failures shall included PDA. verified failures group subgroup after burn-in divided total number devices submitted burn-in that shall used determine percent defective that lot, shall accepted rejected based applicable device class.
Constant acceleration (method 2001 MIL-STD-883). Test condition shall used case
Quality conformance inspection. Quality conformance inspection shall accordance with MIL-M-38falO. Inspections performed shall those specified method 5005 MIL-STD-883 herein groups Inspections (see 4.4.1, 4.4.2, 4.4.3, 4.4.4).
Group inspection. Group inspection shall accordance with table method 5005 MIL-SIU-883 follows:
Subgroups shall omitted.
Tests shall specified table herein.
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Notes
4.19 4.70 0.41 0.48 0.41 0.53 8.51 9.40 7.75 8.51 5.08 T.P. 2.54 T.P. LZ'l 0.71 0.86 0.74 1.14 0.23 1.04 12.70 LZ'l 6.35
Inches .335 .370 .305 .335 .200 T.P. .100 T.P. .050 .028 .034 .029 .045 00S' .050 .250 T.P.
CL-r-
r-M-
Oidi
t-1. Mlt-H
-i->
>^&CM
cnjD
i-+J
O-Eh
This Material Copyrighted Respective Manufacturer
TERM
SEATING PLANE
NOTES:
Dimensions shall measured inches.
Metric equivalents given general information only. (Two leads) applies between .500 (12.70 from seating plane. Diameter uncontrolled beyond .500 (12.70 from seating plane. leads.
holes.
holes located true position within diameter .010 (0.25 mm).
Leads having maximum diameter .043 (1.09 mm)measured gauging plane .054 (1.37 +.001 (0.03 -.000 (0.00 below seating plane shall located at^true position within diameter .014 (0.36 mm).
mounting surface header shall flat convex within .003
(0.08 inside .930 (23.62 diameter circle center header flat convex within .006 (0.15 overall.
Dimensions
Inches Millimeters
.250 .450 6.35 11.43
1.177 1.197 29.90 30.40
.038 .043 0.97 1.09
.875 22.22
.655 .675 16.64 17.14
.420 .440 10.67 11.18
.205 .225 5.21 5.72
.060 .135 1.52 3.43
.151 .161 3.84 4.09
.312 .500 7.92 12.70
.050 1.27
.495 .525 12.57 13.34
.131 .188 3.33 4.78
FIGURE Case outline
MIL-M-38510/.107C
Device types Case
GROUND*
Oevlce types Case INPUT-
"GROUND*
OUTPUT INPUT
NOTE: Bottom views.
FIGURE Terminal connections.
OUTPUT Mease connected ground.)
INPUT
OUTPUT
FIGURE Block diagram.
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Device types
**Added Vqiit R2i.13.3ko. TTot connected device type
FIGURE Functional schematic circuits Continued.
Device type value
7.575
10.875
20.875
MIL-M-38510/107C
(SEE NOTE
notes:
device types device types Jind m^mm m1nutes.
KY.S ^"capacitor ^nated provided device
remains stable.
FIGURE burn-in test circuit.
(SEE TABLE) input
1.0/xF (SEE NOTE
output
ai^F
(SEE .2)_
(SEE TABLE)
Device table.
Devi type
note 137ft 316ft 316ft 316ft
NOTES:
Test conducted without heat sink.
capacitor and/or capacitor reduced eliminated provided device remains stable.
case outline case outline 680n
FIGURE Burn-in test operating life test circuit.
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MIL-M-38510/.107C
=+l5v
LINE REGULATION WAVEFORMS
(HIGH) (see note?)
INPUT
(see note vin(low)-
(max)
-.5ms
STROBE
(SEE NOTE
I'l|
(see note
Nm,N
(see note ,5mi
LOAD REGULATION WAVEFORMS P.W. 6.0ms
-OUTPUT VOLTAGE
6.0ms-P. R.R. (MAX)
strobe (see note
FIGURE Test circuit static tests device types
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motes:
Output terminal must utilize kelvin connection.
test duration: second maximum. Position test.
Position other tests.
pulse generator following characteristics:
Pulse amplitude volts.
Pulse width
Duty cycle percent (maximum).
Load current determined voltage across resistor. Measurements shall made after start pulse.
alternate drive circuit 2N6294 transistor used develop proper load current through resistor.
position I$CD> tests only.
Thermal shutdown output voltage test conducted without heat sink ambient temperature
vIN(L0W) VIN(HIGH) accordance with table III.
The1 output8voltage sampled specified intervals. Strobe pulse width maximum.
11|_ minimum |I|_| maximum accordance with table III.
Vrlqad VRL0AD
Device type
Alternate point applying load circuit directly with automatic test equipment (place position
capacitor added dampen oscillations during test device types through
FIGURE Test circuit static tests device types Continued.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
(.SEE NOTE
Jour
(SEE NOTE
50/^F
OPULSE
(SEE NOTE
VOUT
AV0UT (SEE TABLE)
Device table.
Device type
18.5 18.5
AV0UT -0.48 -1.13 -1.43 -2.28 -0.48 -1.13 -1.43 -2.28
110ft 300ft 390ft 680ft 110ft 300ft 390ft 680ft
MOTES:
2N6187 2N4033 equivalent. 2N3108 equivalent. 1N3873 equivalent. 1N3873 equivalent.
pulse, VDUise, following characteristics: Pulse width
Pulse repetition rate Pulse amplitude
Adjust forced output voltage condition during application Vpuise.
Kelvin connections shall made directly 0.5n resistor. overload current (Vi) amperes.
overload current test checks device current limiting, measure output peak current.
FIGURE Overload current test circuit device types 091-
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
Device type
40.2ft 40.2ft 121ft 191ft 14.3ft 34ft 43.2ft 68.1ft
shall type equivalent. *This value shall used case case 14.3ft.
l?TEei 2400 (measured input terminals D.U.T.) Ripple rejection (db) logici rmsN
rms/
shall minimum value prevent oscillations device under
test. maximum value shall meter shall have minimum bandwidth from shall measure true voltages.
FIGURE Ripple rejection test circuit device types.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
Device table.
Device type
loon lOOn 237n 301n 49.9n 12ln 150n 237n
shall type equivalent. *This value shall used case case 49.9n.
NOTES:
meter measuring shall shall measure true
rms.
have minimum bandwidth from voltages.
FIGURE Noise test circuit device types.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C NOTED
Device type 01,02,06 03,07 04,08 05,09
shall type equivalent.
pulse characteristics shall established under load while D.U.T. operating, ^TLH
AVIN
percent duty cycle.
aVqut maximum (this guarantees specification limit mV/V).
snail minimum value prevent device oscillations.
FIGURE Line transient response test circuit device types.
This Material Copyrighted Respective Manufacturer
(SEE TABLE
INPUT
INPUT
MIL-M-38510/107C
OUTPUT
2N3I08 EQUIVALENT |3900pF
L-<>-\VV-<>-C
PULSE (SEE NOTE
PULSE
(SEE NOTE
_VPULSE(SEE N0TE
OUTPUT (SEE NOTE
AVquT
INPUT PULSE
Device type
loon lOOn 243U 301ft 487ft 49.9n 150ft 243ft
*Load resistor type equivalent. **Thi<; value shall used case case 49.9n.
l?TEThe pulse characteristics shall established under load while D.U.T. operating. tTHL tTLH
percent duty cycle.
VPULSE device types (case
vPULSE dev1ce *ypes (case 092. maximum device type (case
aV0UT maximum device type (case
aVquj maximum device types
aVqut 1000 maximum device types
(These values guarantee specified limits load transient response.) Oscilloscope bandwidth shall greater than MHz.
FIGURE Load transient response test circuit device types.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
Switch positions Measure
Parameter Test (mA) Value Units Measured parameters equation Units
VOUT VOUT
notes VOUT
note VOUT
note VOUT
VOUT
note v0UT
VRLINE VRLIME E8-E7 1,000
vL0AD vL0AD E10-Eg 1,000
notes
FIGURE Test circuit static dynamic tests device type
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
o->-
COr-
l/V-
cncvj
OJT3 invi
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
notes:
25ii percent case percent case
Voltage source shall variable power supply capable producing following input waveform. Device shall turn shall remain when input returned
FIGURE Start-up input voltage test circuit device type
This Material Copyrighted Respective Manufacturer
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Load current Unitsl Notes
Input voltage case case
VOUT jViN 4.70 5.40
|VIN -0.5 -1.5
-0.5
-1.5
-100 -1.0
vRL0AD !HAX -100
!MAX -0.5 !MAX -1.5
isco -10.0 +0.5
-0.5
(load) -0.8 +0.8
!MAX -0.5 'MAX -1.5
-2.0 0.01 Case
-2.8 0.01 Case
VSTART Case 25ft figure
Case *S%)
footnotes table.
TABLE III. Group inspection device t>pe Continued.
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Load current Limits Unitsl Notes
Input voltage case case
+125 VOUT 4.70 5.40
-0.5 -1.5
-0.5
-1.5
jVlN
|VlM -1.0
"rune -100
vRL0AD lvIN -100 +100
-0.5 JT.5
-10.0
-0.5 +0.5
(load) IMAX -0.8
^MAX -1.5
|VIN -2.0 0.01 Case
-2.8 0.01 Case
"start Case *5%) figure
Case *5%)
footnotes table.
MIL-M-38510/.107C
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
_i<e
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
CVJHrH
V|V|
l-l>-
This Material Copyrighted Respective Manufacturer
MIL-M-38510/.107C
figure waveforms 1/4/ figure
Cdr-lrH
Load current
v|v| forced -0.48
v|v| h-=3
C3T3
This Material Copyrighted Respective Manufacturer
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Limits Units Notes
Input voltage Load current
-55'C VOUT -500 4.75 5.25
-500
Vrline -350 -150 +150 figure waveforms
vrl0ad 1-500 -100 -150 +100 +150
iscd -7.0 -8.0 -0.5 -0.5
(line) -1.0 +1.0
1-500 -0.5 +0.5 alscd
-2.00 -1.50 -1.00 -0.01 -0.01 -0.01
forced aV0UT -0.48 -2.0 -0.5 figure
footnotes table.
TABLE III. Group inspection device t>pe Continued.
Subgroup Symbol conditions (figure unless otherwise specified) Units Notes
Test Limits Input voltage Load current
AVIN 2,400 -125 figure
figure
AVOUT Vpulse mV/V figure
AVOUT -200 mV/mA figure
VOUT 4.751 5.25 figure
VOUT figure
AVOUT -2.0 +2.0 figure AvOUT (V60 V61>
VOUT figure
AVOUT -2.0 +2.0 figure AV0UT (V60 v63) 12.5
footnotes table.
TABLE III. Group inspection device type
Conditions (figure unless otherwise specified)
Subgroup Symbol Test! Limits Units Notes
Input voltage Load current
VOUT rria -0.5 11.40 12.60
-0.5
vRLINE -350 -360 -120 +360 +120 figure waveforms
vrload Vjjj -500 -240 -360 +240 +360
ISCD -7.0 -8.0 -0.5 -0.5
(ifne) -1.0 +1.0 AlsCD
Sash -500 -0.5 +0.5 AlsCD
-1.75 -1.25 -1.00 -0.01 -0.01 -0.01
forced AVQUT -1.13 -2.0 -0.5 figure
footnotes table.
TABLE III. Group inspection device type Continued
Conditions (figure unless otherwise specified) Units
Subgroup Symbol Test Limits Motes
Input voltage Load current
+125*0 VOUT -0.5 11.401 12.6G
-0.5
vrline -350 -360 -120 +360 +120 figure waveforms
vRLOAD 1-500 1-50 <~IL -240 -360 +240 +360
ISCD -7.0 -8.0 -0.5 -0.5
(i?ne) -1.0 +1.0 AlSCO
AlSCD l(load) 1-500 -0.5 +0.5 AISCD
-1.75 -1.25 -1.00 -0.01 -0.01 -0.01
Vjjj forced aV0UT -1.13 -2.0 -0.5 figure
+150 VOUT vjfj 11.28 12.721
footnotes table.
TABLE III. Group inspection device type Continued.
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Input voltage Limits Units Notes
Load current
IVIN 11|_ -0.5 11.40 12.60
-0.5
IVIN |I|_ |I|_
]vrline| -350 -360 -120 +360 +120 figure waveforms
|vrload| |VIN 1-500 i-50 -240 -360 +240 +360
iiscd IVin 111_ -7.0 -8.0 -0.5 -0.5
ite! -1.0 +1.0 AlSCD
1AlSCD 1(load)1 |VIN 1-500 -0.5 +0.5 AlSCD
|VIN -1.75 -1.25 -1.00 -0.01 -0.01 -0.01
forced UfrouT -1'13 -2.0 -0.5 figure
footnotes table.
TABLE III. Group inspection device type Continued.
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Input voltage Limits Units Notes
Load current
AVIN IV1N le-j 2,400 -125 figure
IVin figure
AVOUT AVIN IVjn Vpulse mV/V figure
AVOUT IVin -200 mV/r.iA figure
VOUT IVin 11.401 12.60 figure
VOUT |VIN figure
AVOUT |VIN -3.0 +3.0 figure AVGUT (V60 V6l)
VOUT IVIN figure
AVOUT |VIN -3.0 +3.0 figure AVOUT (V60 V63) 12.5
footnotes table.
TABLE III. Group inspection device type
Conditions (figure unless otherwise specified) Units Notes
Subgroup Symbol Test Limits
Input voltage Load current
Vout |VIN 18.5 itiA -500 14.25 15.751
|VIN
|VIN
vrline 118.5 -350 -150 +150 figure waveforms
vrl0ad |VIN -500 -300 -450 +300 +450
iscd vjfj |vin -7.0 -8.0 -0.5 -0.5
fJSCD. (line) 118.5 -1.0 +1.0
aISCD (load) |VIN -500 -0.5 +0.5 AISCD
|VIN |VIN -1.75 -1.00 -0.011 -0.011
|VIN 18.5 forced UVQUT -1.43 -2.0 -0.5 figure
footnotes table.
MIL-M-38510/107C
-I-I
cnin
vj-1
vl1,
(JIS
oyr-
This Material Copyrighted Respective Manufacturer
TABLE III. Group inspection device type Continued.
(figure unless Conditions otherwise specified) Units Notes
Subgroup Symbol Test Input voltage Limits
Load current
18.5 11|_ -500 14.25 15.75
-500
vrline| 18.5 V|IL -350 -150 +150 figure waveforms
vrload| 1-500 1-50 -300 -450 +300 +450
ISCD III. -7.0 -8.0 -0.5 -0.5
u^ne) 18.5 V|IL -1.0 +1.0
1-500 -0.5 +0.5 AlSCD
-1.75 -1.00 -0.01 -0.01
18.5 forced AVQUT -2.0 -0.5 figure
footnotes table.
TABLE III. Group inspection device type Continued.
Subgroup
+125
Symbol
AVlN
AV0UT
aVouT
AVOUT
Test
VOUT
VOUT
AVquT
VOUT
AVOUT
Conditions (figure unless otherwise specified)
Input voltage
2,400
Vili Vpulse
Vinj
Load current
-125
-200
Limits
14.25
-3.75
-3.75
15.75
+3.75
+3.75
Units
mV/V
mV/iriA
Notes
figure
figure
figure
figure
figure
figure
figure AVOUT
(V54 V55)
figure
figure
AVouT
(v54 v57)
12.5
footnotes table.
TABLE III. Group Inspection device type
Subgroup Symbol Conditions (figure unless otherwise specified) Units Notes
Test L1mi
Input voltage Load current
VOUT |VIN 111_ -500 22.80 25.20
|VIN -500
|VIN 11[_
vrline| -350 -720 -240 +720 +240 figure waveforms
vrload| 1Vtu |VIM |-500 1-50 -480 -720 +480 +720
|VIN 11|_ -7.0 -8.0 -0.5 -0.5
cifSBsi -1.0 +1.0 AlSCD
aISCD (load)| |VIN 1-500 -0.5 +0.5 AISCD
|VIN 1VTU |VIN -1.25 -1.00 -1.00 -0.01 -0.01 -0.01
|VtN forced |A&out -2.28 -2.0 -0.5 figure
footnotes table.
MIL-M-38510/107C
CTiH-
v|v|
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
oiin
v|v|
00''-
CJ<0
This Material Copyrighted Respective Manufacturer
TABLE III. Group inspection device type Continued.
Subgroup Conditions (figure unless otherwise specified) Units! Notes
Symbol Test Input voltage Load current
AVin aV0UT 2,400 -125 figure
+25*C rmsl figure
AVOUT AVin Vpulse mV/V figure
AVOUT -200 mV/mA figure
VOUT 22.80 25.20 figure
+125*C VOUT figure
avout -6.0 +6.0 figure 1AVOUT (V60 v6l)
IVOUT |VIN figure
IaVQUT IVIN -6.0 +6.0 figure iaVout (V60 V63> 12.5
footnotes table.
MIL-M-38510/107C
i-<U
Oi<*~
v|v|
v|v|
V|V|
V|V|
i-HCO
00"-
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
Cf><4- O)LO
v|v|
v|v|
v|v|
v|v|
tSYr- IflO
This Material Copyrighted
Respective Manufacturer
TABLE III. Group inspection device type Continued.
Subgroup |Symbol| Conditions (figure unless otherwise specified)
Test Input voltage Limi Units Notes
Load current
|VIN -1.0 4.75 5.25
|VIN -1.0
|VIN -0.1
-0.1 -0.5 -150 +150 figure waveforms
vRL0AD |VIN 1-1.0 1-0.1 -100 -150 +100 +150
IYin jVlM -7.0 -8.0 -0.5 -0.5
ine)I -1.0 +1.0 AlSCD
1AlSCD l(load)| 1-1.0 -0.5 +0.5 AlSCD
lios -4.00 -3.00 -2.00 -0.02 -0.02 -0.02
1VIN forced UV0UT -0.48 -4.0 -1.0 figure
footnotes table.
TABLE III. Group inspection device type Continued.
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Input voltage Limits Units Notes
Load current
=4*25-C aVIN aV0UT !VIN 2,400 -350 figure
-0.1 figure
AVOUT aVIN Vpulse mV/V figure
AVOUT -100 |aI|_ -400 mV/mA figure
VOUT 4.751 5.25 figure
VOUT figure
AVOUT -2.0 +2.0 mV/'C figure v6i>
Ass'C VOUT figure
avout -2.0 +2.0 mv/"c figure aVoUT (V60 V63> 12.5
footnotes table.
MIL-M-38510/107C
a%<*~ COLO
v|v|
v|v|
v|v|
v|v|
-4->
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
v|v|
v|v|
v|v|
h-ZO
*j-cm
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
v|v|
v|v|
v|v|
v|v|
<ti-
^l-lo
This Material Copyrighted Respective Manufacturer
TABLE III. Group inspection device type Continued.
Subgroup
+25'C
-55*C
Symbol
aVin
aVout
aVin
avout
VOUT
VOUT
aVqut
Vqut
Test
Conditions (figure unless otherwise specified)
Input voltage
2,400
Vpuise
Load current
-350
-0.1
-100 -400
Limits
11.40
-3.0
-3.0
12.60
+3.0
+3.0
mV/V
mV/mA
mv/*c
Notes
figure
figure
figure
figure
figure
figure
figure
Vgl)
figure
figure
(V60 v63)
12.5
footnotes table.
MIL-M-38510/107C
"v.,
-t->
V|V|
v|v|
-t->
OO-r-
This Material Copyrighted Respective Manufacturer
H-en
ri-ai
TABLE III. Group inspection device type Continued.
Conditions (figure unless otherwise specified) Units Notes
Subgroup Symbol Test Input voltage Limits
Load current
Vout 18.5 -1.0 14.25 15.75
-1.0
-0.1
vrline 18.5 -0.5 1-150 figure waveforms
vrl0ad -1.0 -0.1 1-300 1-450 +300 +450
iscd -7.0 -8.0 -0.5 -0.5
ine) 18.5 -1.0 +1.0 AlsCD
(load) -1.0 -0.5 +0.5 AlSCD
-3.50 -2.00 -0.02 -0.02
18.5 forced aV0UT -1.43 -4.0 -1.0 figure
jvout +150 14.10 15.90
footnotes table.
MIL-M-38510/107C
r-co
C7>M-
V|V|
v|v|
<SY<-
Oli/)
h40>
This Material Copyrighted Respective Manufacturer
TABLE III. Group inspection device type Continued.
Symbol Conditions (figure unless otherwise specified) Limits Units Notes
Subgroup Test
Input voltage Load current
AVlN AV0UT 2,400 -350 figure
+25*C -0.1 figure
AVOUT AVin Vpulse mV/V figure
AVOUT -100 -400 mV/mA figure
VOUT 14.251 15.75 figure
+125*C VOUT figure
AVOUT -3.751 +3.75 mV/'C figure AVOUT (V54 v55)
VOUT figure
UVQUT -3.751 +3.75 figure aVqut (V54 v57) 12.5
footnotes table.
TABLE III. Group inspection device type Continued.
Conditions (figure unless otherwise specified)
Subgroup Symbol Test Input voltage Limits Units Notes
Load current
-1.0 22.80 25.20
-1.0
jit- -0.1
VRLINE j!t: -0.1 -0.5 -720 -240 +720 figure waveforms
vRL0AD 1-1.0 1-0.1 -480 -720 +480 +720
-7.0 -8.0 -0.5 -0.5
n?S2> -1.0 +1.0 AlSCD
1-1.0 -0.5 +0.5 AlsCD
-2.50 -2.00 -0.02 -0.005
forced -2.28 -4.0 -1.0 figure
footnotes table.
TABLE III. Group inspection device type Continued.
(figure unless Conditions otherwise specified)
Subgroup Symbol Test Input voltage Units Notes
Load current
+125*C VOUT -1.0 22.80 25.20
-1.0
-0.1
VRLINE -0.1 -0.5 -720 -240 +720 +240 figure wavefdnns
vRL0A0 1-1.0 1-0.1 -480 -720 +480 +720
jlL- -7.0 -8.0 -0.5 -0.5
Iai$CD l(line) -1.0 AlSCD
'4lSCD l(load) 1-1.0 -0.5 +0.5
-2.50 -2.00 -0.02 -0.005 1/4/
forced AVOUT -2.28 -4.0 -1.0 figure
+150 VOUT 22.56
footnotes table.
TABLE III. Group inspection device type Continued.
Symbol conditions (figure unless otherwise specified) Units Notes
Subgroup Test Limi
Input voltage Load current
-55*C -1.0 22.80 25.20
-1.0
-0.1
VRLINE -0.1 -720 -240 figure waveforms
vRL0AD 1-1.0 IL'< 1-0.1 -480 -720
-7.0 -8.0 -0.5 -0.5
fJSCD, (line) -1.0 AlSCD
'AlSCD l(load) 1-1.0 -0.5 +0.5 AlSCD
!l0S -2.50 -2.00 -0.02 -0.005
!Iol forced a$out -2.28 -4.0 -1.0 figure
footnotes table.
TABLE III, Group Inspection device type Continued.
Subgroup
Symbol
Test
+25*C
aVin
+25*C
AVOUT
VOUT
A*0UT
VOUT
Conditions (figure unless otherwise specified)
Input voltage
2,400
Vpulse
Load current
-350
-0.1
-100 -400
Limits
22.80
-6.0
-6.0
25.20
+6.0
Units
mV/V
mV/mA
mV/'C
Notes
figure
figure
figure
figure
figure
figure
figure iVouT
v58)
figure
figure *v0UT
12.5
second maximum test duration.
meter shall have minimum bandwidth from shall measure true voltages.
device types through tests performed +125*C may, manufactyrer's option, performed Specifications +125'*C shall then apply +150
capacitor added dampen oscillations during test device types through overload current test checks device current Uniting, Measure output peak current.
MIL-M-38510/107C
4.4.2 Group inspection. Group inspection shall accordance with table
method 5005 MIL-STD-883 follows:
End-point electrical parameters shall specified table herein.
Life test class shall performed +125*C 1,000 hours quantity devices with failures accordance with group subgroup substitute subgroup table lia. sample falls quantity (accept number), Individual devices acceptable they pass 1,000 hours additional burn-in does exceed percent.
Constant acceleration class (method 2001 MIL-STD-883). Test condition shall used case
4-4.3 Group Inspection. Group inspection shall accordance with table
method 5005 MIL-STD-883 follows:
End-point electrical parameters shall specified table herein.'
Life tests class (method 1005 MIL-STD-883): Test condition only using circuits shown figure Accelerated test conditions shall used.
Constant acceleration (method 2001 MIL-STD-883). Test condition shall used case
4.4.4
GrouP_P in!Pgction. Group inspection shall accordance with table method 5005 MIL-STD-883 follows:
point electrical parameters shall specified table herein.
Constant acceleration (method 2001 MIL-STD-883). Test condition shall used case
4-4-5 _InsPec**on packaging. Inspection packaging shall accordance with MIL-M-38510.
Methods examination test. Methods examination test shall specified appropriate tables. Electrical test circuits prescribed herein referenced test methods MIL-STD-883 shall acceptable. Other test circuits shall require approval qualifying activity.
f-5-1 Vo1tage current. voltage values given, except input offset voltage differential voltage) referenced external zero reference level supply voltage. Currents given conventional current positive when flowing into referenced terminal.
4;5.2 Burn-1n life test cooldown procedures. When devices measured
following application steady-state life burn-in test condition,
they shall cooled within +10*C their power stable condition prior removal bias.
PACKAGING
Packaging requirements. requirements packaging shall accordance with MIL-M-38510.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
TABLE Group end-point electrical parameters +25*C).
Device Characterlst1c Symbol limits Limits Unit
Line regulation Load regulation Standby current Output voltage drai VRLINE vRL0AD isco V0UT 4.701 5.401
Output voltage Standby current drain 4.751 -7.0 5.251 -0.5
Output voltage Standby current drain youT 11.401 -7.0 12.601 -0.5
Output voltage Standby current drain 14.251 -7.0 15.751 -0.5
Output voltage Standby current drain youT 22.801 -7.0 25.201 -0.5
Delta limits apply measured value (see delta limit definition MIL-M-38510.
NOTES
(This section contains information general explanatory nature that helpful, mandatory.)
Intended use. Microcircuits conforming this specification Intended original equipment design applications logistic support existing
equi pment.
Acquisition requirements. Acquisition documents must specify following:
(see .6).
Requirements delivery copy quality comformance inspection data pertinent device Inspection supplied with each shipment device manufacturer, applicable.
Requirements certificate compliance, applicable.
Requirements notification change product process acquiring activity addition notification qualifying activity, applicable.
Requirements failure analysis (Including required test condition method 5003 MIL-STD-883), corrective action, reporting results, applicable.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
Requirements product assurance options.
Requirements special lead lengths lead forming, applicable.
These requirements shall affect PIN.
Requirements "JAN" marking.
Abbreviations, symbols, definitions. Abbreviations, symbols, definitions used herein defined MIL-M-38510, MIL-STD-1331, follows.
6.3.1 Line regulation. change output voltage specified change Input voltage (v^line^ Tfor device type "The percentage change").
6.3.2 Load regulation. change output voltage specified change load current (vrlqad' lfor device type ''The percentage change").
6.3.3 R1pple rejection. ratio peak-to-peak input ripple voltage peak-to-peak output ripple voltage (aVquj
aVin).
6.3.4 Average temperature coefficient output voltage. percentage change output voltage specified change ambient temperature (aVqut
6.3.5 Output noise voltage. output noise voltage with constant load Input ripple (N0).
6.3.6 Standby current drain. supply current drawn regulator with output load with output load.
6.3.7 Input voltage range. range supply voltage over which regula will operate.
6.3.8 Output voltage range. range output voltage over which regulator will operate.
6.3.9 Transient response. closed-loop step function response regula under small-signal conditions.
6.3.10 Start-up input voltage. minimum Input voltage required obtain specified output voltage (for device type only).
Logi support. Lead material finishes (see 3.3) interchangeable. Unless otherwise specified, microcircuits acquired Government logistic support will acquired device class (see 1.2.2), 1ead.materlal finish (see 3.3). Longer length leads lead formimg shall affect PIN.
This Material Copyrighted Respective Manufacturer
MIL-M-38510/107C
Substltutabll1ty cross-reference Information below presented convenience users. Microcircuits covered this specification will functionally replace listed generic-Industry type. Generlc-1ndustry microcircuit types have equivalent operational performance characteristics across military temperature ranges reliability factors equivalent MIL-M-38510 device types have slight physical variations relation case size. presence this information shall deemed permitting substitution generic-Industry types MIL-M-38510 types waiver provisions MIL-M-38510.
Military device Generlc-1ndustry type_type_
LM109
LM140H-05, 78M05
LM140H-12, 78M12
LM140H-15, 78M15
LM140H-24, 78M24
LM140K-05, 7805
LM140K-12, 7812
LM140K-15, 7815
LM140K-24, 7824
PIN. shall accordance with MIL-M-38510.
Changes from previous issue. Marginal notations used this revision Identify change with respect previous issue extenslveness changes.
Custodians: Army Navy Force NASA
Review acti v111es: Army Navy Force
User activities: Army Navy
CONCLUDING MATERIAL
Preparing activity: Force
Agent
(Project 5962-1145)
This Material Copyrighted Respective Manufacturer

MIL-M-38510/107C 1989_ superseding- MIL-M-38510/107B No

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