SCCS012

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SCCS012 - SCCS012

CY29FCT818T
SCCS012 1994 Revised February 2000
Diagnostic Scan Register
designed applications, such diagnostics sequential circuits, where desirable load known data specific location circuit read data that location. shadow registers load data from output FCT818T, used right-shift register with bit-serial input output SDO, using DCLK. data register input multiplexed enable loading from shadow register from data input pins using PCLK. Note that data loaded simultaneously from shadow register pipeline register, from pipeline register shadow register provided set-up hold time requirements satisfied with respect independent clock inputs. typical application, general-purpose register FCT818T replaces 8-bit data register normal data path system. shadow register placed auxiliary bit-serial loop which used diagnostics. During diagnostic operation, data shifted serially into shadow register, then transferred general purpose register load known value into data path. read contents that point data path, data transferred from data register into shadow register, then shifted serially auxiliary diagnostic loop make accessible diagnostics controller. This data then compared with expected value diagnose faulty operation sequential circuit. outputs designed with power-off disable feature allow live insertion boards.
Features
Function, pinout drive compatible with FCT, Logic AM29818 FCT-C speed max. (Com'l), FCT-A speed 12.0 max. (Mil) Reduced (typically 3.3V) versions equivalent functions Edge-rate control circuitry significantly improved noise characteristics Power-off disable feature Matched rise fall times Fully compatible with input output logic levels Sink current (Com'l), (Mil) Source current (Com'l), (Mil) 8-Bit pipeline shadow register 2000V
Functional Description
FCT818T contains high-speed 8-bit general-purpose data pipeline register high-speed 8-bit shadow register. general-purpose register used 8-bit wide data path normal system application. shadow regis-
Logic Block Diagram
Configurations
View
DIP, SOIC, QSOP View
DCLK MODE PCLK
DCLK
D0-D 8-BIT SHADOW REGISTER PCLK
S0-S
2021 222324 MODE
DCLK MODE
8-BIT PIPELINE REGISTER P0-P
PCLK
Y0-Y
Copyright
2000, Texas Instruments Incorporated
CY29FCT818T
Function Table[1]
Inputs MODE DCLK Inputs PCLK Shadow Register S0SDI SiSi-1 SiYi Hold Pipeline Register PiDi PiSi Operation Serial Shift; D7-D0 Output Disabled Load Pipeline Register from Data Input Load Shadow Register from Output Hold Shadow Register; D7-D0 Output Enabled Load Pipeline Register from Shadow Register
Maximum Ratings[2,
(Above which useful life impaired. user guidelines, tested.) Storage Temperature .-65°C +150°C Ambient Temperature with Power Applied .-65°C +135°C Supply Voltage Ground Potential -0.5V +7.0V Input Voltage. -0.5V +7.0V Output Voltage -0.5V +7.0V Output Current (Maximum Sink Current/Pin).120
Power Dissipation 0.5W Static Discharge Voltage.>2001V (per MIL-STD-883, Method 3015)
Operating Range
Range Commercial Military[4] Range Ambient Temperature -40°C +85°C -55°C +125°C
Electrical Characteristics Over Operating Range
Parameter Description Output HIGH Voltage Test Conditions VCC=Min., IOH=-32 VCC=Min., IOH=-15 VCC=Min., IOH=-3 IOZH IOZL IOFF Output Voltage Input HIGH Voltage Input Voltage Hysteresis[6] Input Clamp Diode Voltage Input HIGH Current Input HIGH Current Input Current State HIGH-Level Output Current State LOW-Level Output Current Output Short Circuit Current[7] Power-Off Disable inputs VCC=Min., IIN=-18 VCC=Max., VIN=VCC VCC=Max., VIN=2.7V VCC=Max., VIN=0.5V VCC=Max., VOUT=2.7V VCC=Max., VOUT=0.5V VCC=Max., VOUT=0.0V VCC=0V, VOUT=4.5V -120 -0.7 -1.2 -225 VCC=Min., IOL=64 VCC=Min., IOL=20 Com'l Com'l Com'l Min. 0.55 0.55 Typ.[5] Max. Unit
CY29FCT818T
Electrical Characteristics Over Operating Range
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
Notes: Applicable Unless otherwise noted, these limits over operating free-air temperature range. Unused inputs must always connected appropriate logic voltage level, preferably either ground. "instant case temperature. Typical values VCC=5.0V, TA=+25°C ambient. This parameter specified tested. more than output should shorted time. Duration short should exceed second. high-speed test apparatus and/or sample hold techniques preferable order minimize internal chip heating more accurately reflect operational values. Otherwise prolonged shorting high output raise chip temperature well above normal thereby cause invalid readings other parameters tests. sequence parameter tests, tests should performed last.
Capacitance[8]
Parameter COUT
Document 38-00275-B
Description Input Capacitance Output Capacitance
Test Conditions
Typ.[5]
Max.
Unit
Power Supply Characteristics
Parameter ICCD Description Quiescent Power Supply Current Quiescent Power Supply Current (TTL inputs HIGH) Test Conditions VCC=Max., VIN<0.2V, VIN>VCC-0.2V VCC=Max., VIN=3.4V, f1=0, Outputs Open
Typ.[5]
Max. 0.25
Unit mA/MHz
Dynamic Power Supply Current[9] VCC=Max., Duty Cycle, Outputs Open, Input Toggling, OE=GND, VIN<0.2V VIN>VCC-0.2V Total Power Supply Current[10] VCC=Max., Duty Cycle, Outputs Open, f0=10 MHz, Toggling f1=5 MHz, OE=GND, VIN<0.2V VIN>VCC-0.2V VCC=Max., Duty Cycle, Outputs Open, f0=10 MHz, Toggling f1=5 MHz, OE=GND, VIN=3.4V VIN=GND VCC=Max., Duty Cycle, Outputs Open, f0=10 MHz, Eight Bits Four Controls Toggling, f1=5 MHz, OE=GND, VIN<0.2V VIN>VCC-0.2V VCC=Max., Duty Cycle, Outputs Open, f0=10 MHz, Eight Bits Four Controls Toggling, f1=5 MHz, OE=GND, VIN=3.4V VIN=GND
17.8[11]
30.8[11]
Notes: driven input (VIN=3.4V); other inputs GND. This parameter directly testable, derived Total Power Supply calculations. IQUIESCENT IINPUTS IDYNAMIC ICC+ICCDHNT+ICCD(f0/2 f1N1) Quiescent Current with CMOS input levels Power Supply Current HIGH input (VIN=3.4V) Duty Cycle inputs HIGH Number inputs ICCD Dynamic Current caused input transition pair (HLH LHL) Clock frequency registered devices, otherwise zero Input signal frequency Number inputs changing currents milliamps frequencies megahertz. Values these conditions examples formula. These limits specified tested.
CY29FCT818T
Switching Characteristics Over Operating Range[12]
FCT818AT Military Parameter Propagation Delay PCLK MODE DCLK Set-Up Time PCLK MODE PCLK DCLK MODE DCLK DCLK DCLK PCLK PCLK DCLK Hold Time PCLK MODE PCLK DCLK MODE DCLK DCLK Output Disable Time DCLK Output Disable Time HIGH DCLK Output Enable Time DCLK Output Enable Time HIGH DCLK Pulse Width PCLK (HIGH LOW) DCLK (HIGH LOW) Package Name P13/13A Description Min. Max. FCT818CT Commercial Min. Max. Unit Fig. No.[13]
tPLZ
Operating Range Commercial
tPHZ
tPZL
tPZH
Speed (ns)
Ordering Code CY29FCT818CTPC CY29FCT818CTQCT CY29FCT818CTSOC/SOCT
Package Type 24-Lead (300-Mil) Molded 24-Lead (150-Mil) QSOP 24-Lead (300-Mil) Molded SOIC 24-Lead (300-Mil) CerDIP
12.0
CY29FCT818ATDMB
Military
Notes: Minimum limits specified tested Propagation Delays. "Parameter Measurement Information" General Information section.
CY29FCT818T
Package Diagrams
24-Lead (300-Mil) CerDIP
MIL-STD-1835 Config.A
28-Square Leadless Chip Carrier
MIL-STD-1835
24-Lead (300-Mil) Molded P13/P13A
CY29FCT818T
Package Diagrams (continued)
24-Lead Quarter Size Outline
24-Lead (300-Mil) Molded SOIC
IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS INVOLVE POTENTIAL RISKS DEATH, PERSONAL INJURY, SEVERE PROPERTY ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). SEMICONDUCTOR PRODUCTS DESIGNED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. INCLUSION PRODUCTS SUCH APPLICATIONS UNDERSTOOD FULLY CUSTOMER'S RISK. order minimize risks associated with customer's applications, adequate design operating safeguards must provided customer minimize inherent procedural hazards. assumes liability applications assistance customer product design. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. TI's publication information regarding third party's products services does constitute TI's approval, warranty endorsement thereof.
Copyright 2000, Texas Instruments Incorporated

SCCS012

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