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MOC3051M MOC3052M


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MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
January 2009
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Excellent stability-IR emitting diode
Description
MOC3051M MOC3052M consist AlGaAs infrared emitting diode optically coupled non-zerocrossing silicon bilateral switch (triac). These devices isolate voltage logic from lines provide random phase control high current triacs thyristors. These devices feature greatly enhanced static dv/dt capability ensure stable switching performance inductive loads.
degradation High isolation voltage-minimum 7500 peak Underwriters Laboratory (UL) recognized- File #E90700, Volume 600V peak blocking voltage IEC60747-5-2 approved (File #94766) Ordering option (e.g. MOC3052VM)
Applications
Solenoid/valve controls Lamp ballasts Static power switch Interfacing microprocessors
peripherals
Solid state relay Incandescent lamp dimmers Temperature controls Motor controls
Schematic
Package Outlines
ANODE
MAIN TERM.
CATHODE
MAIN TERM.
CONNECT (TRIAC SUBSTRATE)
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Absolute Maximum Ratings 25°C unless otherwise specified.) Stresses exceeding absolute maximum ratings damage device. device function operable above recommended operating conditions stressing parts these levels recommended. addition, extended exposure stresses above recommended operating conditions affect device reliability. absolute maximum ratings stress ratings only.
Symbol
TOTAL DEVICE TSTG TOPR TSOL VISO EMITTER Continuous Forward Current Reverse Voltage Total Device Power Dissipation 25°C Derate above 25°C DETECTOR VDRM ITSM Off-State Output Terminal Voltage Peak Repetitive Surge Current 100ms, 120pps) Total Power Dissipation 25°C Ambient Derate above 25°C mW/°C 1.33 mW/°C Storage Temperature Operating Temperature Lead Solder Temperature (Wave Solder) Junction Temperature Range Isolation Surge Voltage(1) (peak voltage, 60Hz, sec. duration) Total Device Power Dissipation 25°C Derate above 25°C +150 +100 7500 Vac(pk) mW/°C
Parameters
Value
Units
Note: Isolation surge votlage, VISO, internal device breakdown rating. this text, pins common, pins common.
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Electrical Characteristics 25°C unless otherwise specified.)
Individual Component Characteristics Symbol
EMITTER IDRM Vdv/dt Input Forward Voltage Reverse Leakage Current Peak Blocking Current, Either Direction Peak On-State Voltage, Either Direction 10mA VDRM, 0(2) 100mA peak, 1000 1.15 0.05 V/µs
Parameters
Test Conditions
Min.
Typ.*
Max.
Units
DETECTOR
Critical Rate Rise Off-State Voltage (Figure 400V)
Transfer Characteristics Symbol
Characteristics
Trigger Current, Either Direction Holding Current, Either Direction
Test Conditions
Main terminal Voltage 3V(3)
Device
MOC3051M MOC3052M
Min.
Typ.*
Max.
Units
Isolation Characteristics Symbol
VISO RISO CISO
Characteristic
Input-Output Isolation Voltage Isolation Resistance Isolation Capacitance
Test Conditions
60Hz, sec. VI-O 500VDC 1MHz
Min.
7500
Typ.*
Max.
Units
Vac(pk)
1011
*Typical values 25°C Notes: Test voltage must applied within dv/dt rating. devices guaranteed trigger value less than equal IFT. Therefore, recommended operating lies between max. MOC3051M, 10mA MOC3052M absolute max. (60mA).
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Typical Performance Curves
Figure. Forward Voltage Forward Current
Figure. On-State Characteristics
ON-STATE CURRENT I(mA)
FORWARD VOLTAGE
-55oC
-200
25oC
-400
100oC
-600
-800
ON-STATE VOLTAGE V(V)
FORWARD CURRENT (mA)
Figure. Trigger Current Ambient Temperature
Figure. Current Required Trigger Pulse Width
IFT, NORMALIZED TRIGGER CURRENT
NORMALIZED PWin
TRIGGER CURRENT (NORMALIZED)
PWin, TRIGGER PULSE WIDTH
NORMALIZED 25°C
AMBIENT TEMPERATURE (oC)
Temperature (normalized)
Figure shows increase trigger current when device expected operate ambient temperature below 25°C. Multiply normalized shown this graph with data sheet guaranteed IFT. Example: -40°C, -40°C
cross detector. same task accomplished microprocessor which synchronized zero crossing. phase controlled trigger current very short pulse which saves energy delivered input LED. trigger pulse currents shorter than 100µs must have increased amplitude shown Figure This graph shows dependency trigger current versus pulse width seen chart delay t(d) versus trigger current. graph versus (PW) normalized respect minimum specified static condition, which specified device characteristic. normalized multiplied with devices guaranteed static trigger current. Example: Guaranteed Trigger pulse width (pulsed) 50mA
Phase Control Considerations
Trigger Current versus (normalized) Random Phase Triac drivers designed phase controllable. They triggered phase angle within sine wave. Phase control accomplished line zero cross detector variable pulse delay generator which synchronized zero
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Minimum Time Phase Control Applications
Phase control applications intends able control each sine half wave from 180°. Turn means full power turn 180° means zero power. This quite possible reality because triac driver triac have fixed turn time when activated zero degrees. phase control angle close 180° driver's turn pulse trailing edge sine wave must limited 200ms before zero cross shown Figure This assures that triac driver time switch off. Shorter times cause loss control following half cycle.
triggering device event fast raising line voltage transients. Inductive loads generate commutating dv/dt that activate triac drivers noise suppression circuits. This prevents device from turning specified trigger current. will this case into mode "half waving" load. Half waving load destroy power triac load. Figure shows dependency triac drivers versus reapplied voltage rise with 400V. This dv/dt condition simulates worst case commutating dv/dt amplitude. seen that does change until commutating dv/dt reaches 1000V/ms. data sheet specified therefore applicable practical inductive loads load factors.
versus dv/dt
Triac drivers with good noise immunity (dv/dt static) have internal noise rejection circuits which prevent false
Figure. Leakage Current, Temperature
10000
180°
IDRM LEAKAGE CURRENT (nA)
Sine
1000
Current
turn min. 200µs
Figure Minimum Time Turn-Off Zero Cross Trailing Edge
AMBIENT TEMPERATURE (oC)
TRIGGER CURRENT (NORMALIZED)
Figure. Holding Current, Temperature
HOLDING CURRENT (mA)
Figure. Trigger Current, dv/dt
0.001 0.01 1000 10000 NORMALIZED
AMBIENT TEMPERATURE (oC)
dv/dt (V/ms)
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
t(delay), t(f) versus
triac driver's turn switching speed consists turn delay time t(d) fall time t(f). Figure shows that delay time depends trigger current, while actual trigger transition time t(f) stays constant with about micro second. delay time important very short pulsed operation because demands higher trigger current very short trigger pulses. This dependency shown graph turn transition time t(f) combined with power triac's turn time important power dissipation this device.
Switching Time Test Circuit
SCOPE VEXT SYNC FUNCTION GENERATOR Vout ISOL. TRANSF. VDUT PHASE CTRL. CTRL. PERIOD CTRL. AMPL. CTRL. ZERO CROSS DETECTOR
mercury wetted relay provides high speed repeated pulse D.U.T. 100x scope probes used, allow high speeds voltages. worst-case condition static dv/dt established triggering D.U.T. with normal input current, then removing current. variable RTEST allows dv/dt gradually increased until D.U.T. continues trigger response applied voltage pulse, even after current been removed. dv/dt then decreased until D.U.T. stops triggering. measured this point recorded.
t(d) t(f)
Figure Delay Time, t(d), Fall Time, t(f), Trigger Current
+400
RTEST
t(delay) t(fall)
PULSE INPUT
t(d)
MERCURY WETTED RELAY
CTEST D.U.T.
X100 SCOPE PROBE
t(f)
APPLIED VOLTAGE WAVEFORM Vmax 400V 252V 0.63V dv/dt
VOLTS
TRIGGER CURRENT (mA)
Figure Static dv/dt Test Circuit
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Applications Guide
Basic Triac Driver Circuit
random phase triac driver family MOC3052M MOC3051M very immune static dv/dt which allows snubberless operations applications where external generated noise line below guaranteed dv/dt withstand capability. these applications snubber circuit necessary when noise insensitive power triac used. Figure shows circuit diagram. triac driver directly connected triac main terminal series Resistor which limits current triac driver. Current limiting resistor must have minimum value which restricts current into driver maximum AC/Imax rep. AC/1A power dissipation this current limiting resistor triac driver very small because power triac carries load current soon current through driver current limiting resistor reaches trigger current power triac. switching transition times driver only micro second power triacs typical four micro seconds.
Triac Driver Circuit Noisy Environments
When transient rate rise amplitude expected exceed power triacs triac drivers maximum ratings snubber circuit shown Figure recommended. Fast transients slowed snubber excessive amplitudes clipped Metal Oxide Varistor MOV.
Triac Driver Circuit Extremely Noisy Environments
specified noise IEC255-4. standards IEEE472
Industrial control applications specify maximum transient noise dv/dt peak voltage which superimposed onto line voltage. order pass this environment noise test modified snubber network shown Figure recommended.
RLED TRIAC DRIVER POWER TRIAC
RLED
TRIAC DRIVER
POWER TRIAC LOAD
LINE CONTROL RET. LOAD RLED (VCC Q)/IFT line/ITSM CONTROL RET.
LINE
Typical Snubber values 0.01 (Metal Oxide Varistor) protects triac driver from transient overvoltages >VDRM max.
Figure Basic Driver Circuit
Figure Triac Driver Circuit Noisy Environments
POWER TRIAC RLED TRIAC DRIVER
LINE
CONTROL LOAD RET. Recommended snubber pass IEEE472 IEC255-4 noise tests 0.01µF
Figure Triac Driver Circuit Extremely Noisy Environments
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Package Dimensions
Through Hole
8.13-8.89
0.4" Lead Spacing
8.13-8.89
6.10-6.60 6.10-6.60
5.08 (Max.) 3.28-3.53 0.25-0.36
7.62 (Typ.)
5.08 (Max.) 3.28-3.53
0.25-0.36
0.38 (Min.)
2.54-3.81 0.38 (Min.) 0.20-0.30 2.54-3.81
(0.86) 0.41-0.51 1.02-1.78 0.76-1.14
2.54 (Bsc)
(Typ.) (0.86) 0.41-0.51 1.02-1.78 0.76-1.14 10.16-10.80 2.54 (Bsc) 0.20-0.30
Surface Mount
8.13-8.89
(1.78) (1.52) (2.54)
6.10-6.60 8.43-9.90
(7.49) (10.54)
(0.76)
Rcommended Layout
0.25-0.36
3.28-3.53 5.08 (Max.) 0.38 (Min.) 2.54 (Bsc) (0.86) 0.41-0.51 1.02-1.78 0.76-1.14 0.16-0.88 (8.13)
0.20-0.30
Note: dimensions
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Ordering Information
Option
option SR2V
Order Entry Identifier (Example)
MOC3051M MOC3051SM MOC3051SR2M MOC3051MOC3051VM MOC3051TVM MOC3051SVM MOC3051SR2VM
Description
Standard Through Hole Device Surface Mount Lead Bend Surface Mount; Tape Reel 0.4" Lead Spacing 0884 0884, 0.4" Lead Spacing 0884, Surface Mount 0884, Surface Mount, Tape Reel
Marking Information
MOC3051
Definitions
Fairchild logo Device number mark (Note: Only appears parts ordered with option order entry table) digit year code, e.g., digit work week ranging from `01' `53' Assembly package code
*Note Parts that have option (see definition above) that marked with date code `325' earlier marked portrait format.
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
Tape Dimensions
12.0 0.20 0.05 0.30 0.05 1.75 0.10
11.5 21.0 0.20 24.0
10.1 0.20
0.1/-0
User Direction Feed
Note: dimensions millimeters.
Reflow Soldering Profile
Time above 183°C >245°C 260°C
1.822°C/Sec Ramp rate
Time
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com
MOC3051M, MOC3052M 6-Pin Random-Phase Optoisolators Triac Drivers (600 Volt Peak)
TRADEMARKS following includes registered unregistered trademarks service marks, owned Fairchild Semiconductor and/or global subsidiaries, intended exhaustive list such trademarks. Build Transfer LogicEcoSPARK® EfficentMaxEZSWITCH*
Fairchild® Fairchild Semiconductor® FACT Quiet Series® FACT FAST® FastvCoreFlashWriter® FPSF-PFS
FRFET® Global Power Resource Green FPSGreen OPTOPLANAR®
Programmable Active DroopQFET® QSQuiet SeriesRapidConfigureSaving world, 1mW/W/kW timeSmartMaxSMART STARTSPM® STEALTHSuperFETSuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SupreMOSSyncFET
TinyBoostTinyBuckTinyLogic® DetectµSerDes
SPMPower-SPMPowerTrench® PowerXS
Ultra FRFETUniFETVCXVisualMaxXS
Power Franchise®
EZSWITCHand FlashWriter® trademarks System General Corporation, used under license Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES RIGHT MAKE CHANGES WITHOUT FURTHER NOTICE PRODUCTS HEREIN IMPROVE RELIABILITY, FUNCTION, DESIGN. FAIRCHILD DOES ASSUME LIABILITY ARISING APPLICATION PRODUCT CIRCUIT DESCRIBED HEREIN; NEITHER DOES CONVEY LICENSE UNDER PATENT RIGHTS, RIGHTS OTHERS. THESE SPECIFICATIONS EXPAND TERMS WORLDWIDE TERMS CONDITIONS, SPECIFICALLY WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL FAIRCHILD SEMICONDUCTOR CORPORATION. used herein: Life support devices systems devices systems which, intended surgical implant into body support sustain life, whose failure perform when properly used accordance with instructions provided labeling, reasonably expected result significant injury user. critical component component life support, device, system whose failure perform reasonably expected cause failure life support device system, affect safety effectiveness.
ANTI-COUNTERFEITING POLICY Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy also stated external website, www.fairchildsemi.com, under Sales Support. Counterfeiting semiconductor parts growing problem industry. manufacturers semiconductor products experiencing counterfeiting their parts. Customers inadvertently purchase counterfeit parts experience many problems such loss brand reputation, substandard performance, failed applications, increased cost production manufacturing delays. Fairchild taking strong measures protect ourselves customers from proliferation counterfeit parts. Fairchild strongly encourages customers purchase Fairchild parts either directly from Fairchild from Authorized Fairchild Distributors listed country page cited above. Products customers either from Fairchild directly from Authorized Fairchild Distributors genuine parts, have full traceability, meet Fairchild's quality standards handling storage provide access Fairchild's full range up-to-date technical product information. Fairchild Authorized Distributors will stand behind warranties will appropriately address warranty issues that arise. Fairchild will provide warranty coverage other assistance parts bought from Unauthorized Sources. Fairchild committed combat this global problem encourage customers their part stopping this practice buying direct from authorized distributors. PRODUCT STATUS DEFINITIONS Definition Terms Datasheet Identification Advance Information Preliminary Identification Needed Obsolete Product Status Formative Design First Production Full Production Production Definition Datasheet contains design specifications product development. Specifications change manner without notice. Datasheet contains preliminary data; supplementary data will published later date. Fairchild Semiconductor reserves right make changes time without notice improve design. Datasheet contains final specifications. Fairchild Semiconductor reserves right make changes time without notice improve design. Datasheet contains specifications product that discontinued Fairchild Semiconductor. datasheet reference information only.
Rev.
©2005 Fairchild Semiconductor Corporation MOC3051M, MOC3052M Rev. 1.0.3
www.fairchildsemi.com

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