| Datasheets.org.uk - 100 Million Datasheets from 7500 Manufacturers. |
FRL234R4
Top Searches for this datasheetP-channel 200V mos fet - P-channel 200V mos fet FRL234R4 - FRL234R4 JANSR2N7278 Formerly FRL234R4 250V, 0.700 Ohm, Hard, N-Channel Power MOSFET Description Intersil Corporation designed series SECOND GENERATION hardened power MOSFETs both N-Channel P-Channel enhancement types with ratings from 100V 500V, 60A, resistance Total dose hardness offered 100K (Si) 1000K (Si) with neutron hardness ranging from 1E13 500V product 1E14 100V product. Dose rate hardness (GAMMA DOT) exists rates without current limiting 2E12 with current limiting. This MOSFET enhancement-mode silicon-gate power field effect transistor vertical DMOS (VDMOS) structure. specially designed processed exhibit minimal characteristic changes total dose (GAMMA) neutron (no) exposures. Design processing efforts also directed enhance survival dose rate (GAMMA DOT) exposure. Also available other radiation screening levels. web, Intersil's home page: http://www.intersil.com. Contact your local Intersil Sales Office additional information. /Title (JANS R2N72 /Subject (4A, 250V, 0.700 Ohm, Hard, NChannel Power MOSFET) /Autho /Keywords (Intersil Corporation, Semiconductor, 250V, 0.700 Ohm, Hard, NChannel Power Features 250V, rDS(ON) 0.700 Total Dose Meets Pre-RAD Specifications 100K (Si) Dose Rate Typically Survives (Si)/s BVDSS Typically Survives 2E12 Current Limited Photo Current Per-RAD(Si)/s Typically Neutron Maintain Pre-RAD Specifications 1E13 Neutrons/cm2 Usable 1E14 Neutrons/cm2 Ordering Information PART NUMBER JANSR2N7278 PACKAGE TO-205AF BRAND JANSR2N7278 family TA17633. MIL-PRF-19500/604. Symbol Packaging TO-205AF ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 Absolute Maximum Ratings 25oC, Unless Otherwise Specified JANSR2N7278 0.20 UNITS W/oC Drain Source Voltage .VDS Drain Gate Voltage (RGS 20k) VDGR Continuous Drain Current 25oC 100oC Pulsed Drain Current Gate Source Voltage. .VGS Maximum Power Dissipation 25oC 100oC Linear Derating Factor Single Pulsed Avalanche Current, 100µH, (See Test Figure). Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Operating Storage Temperature TSTG Lead Temperature (During Soldering) (Distance >0.063in (1.6mm) from Case, Max) Weight (Typical) CAUTION: Stresses above those listed "Absolute Maximum Ratings" cause permanent damage device. This stress only rating operation device these other conditions above those indicated operational sections this specification implied. Electrical Specifications PARAMETER 25oC, Unless Otherwise Specified SYMBOL BVDSS VGS(TH) TEST CONDITIONS 1mA, VDS, -55oC 25oC 125oC 25oC 125oC 125V, 2.94 0.700 1.68 UNITS oC/W oC/W Drain Source Breakdown Voltage Gate Threshold Voltage Zero Gate Voltage Drain Current IDSS 200V, ±20V 25oC 125oC 25oC 125oC Gate Source Leakage Current IGSS Drain Source On-State Voltage Drain Source Resistance VDS(ON) rDS(ON) 10V, Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge (Not Slash Sheet) Gate Charge Threshold Gate Charge (Not Slash Sheet) Gate Charge Source Gate Charge Drain Thermal Resistance Junction Case Thermal Resistance Junction Ambient td(ON) td(OFF) Qg(TOT) Qg(10) Qg(TH) 125V, 31.3, 10V, ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 Source Drain Diode Specifications PARAMETER Forward Voltage Reverse Recovery Time SYMBOL dISD/dt 100A/µs 25oC, Unless Otherwise Specified SYMBOL (Note (Note (Notes (Note (Notes (Notes BVDSS VGS(TH) IGSS IDSS VDS(ON) rDS(ON) TEST CONDITIONS VDS, ±20V, 200V 10V, 10V, 2.94 0.700 UNITS TEST CONDITIONS UNITS Electrical Specifications 100K PARAMETER Drain Source Breakdown Volts Gate Source Threshold Volts Gate Body Leakage Zero Gate Leakage Drain Source On-State Volts Drain Source Resistance NOTES: Pulse test, 300µs Max. Absolute value. Insitu Gamma bias must sampled both 10V, BVDSS Typical Performance Curves Unless Otherwise Specified 25oC DRAIN CURRENT DRAIN 100µs OPERATION THIS AREA LIMITED rDS(ON) DRAIN SOURCE VOLTAGE 10ms 100ms CASE TEMPERATURE (oC) FIGURE MAXIMUM CONTINUOUS DRAIN CURRENT CASE TEMPERATURE FIGURE FORWARD BIAS SAFE OPERATING AREA NORMALIZED THERMAL IMPEDANCE (ZJC) 0.05 0.02 0.01 SINGLE PULSE NOTES: DUTY FACTOR: t1/t2 PEAK 0.01 0.001 10-5 10-4 10-3 10-2 10-1 RECTANGULAR PULSE DURATION FIGURE NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 Test Circuits Waveforms ELECTRONIC SWITCH OPENS WHEN REACHED CURRENT TRANSFORMER BVDSS VARY OBTAIN REQUIRED PEAK 50V-150V FIGURE UNCLAMPED ENERGY TEST CIRCUIT FIGURE UNCLAMPED ENERGY WAVEFORMS td(ON) tOFF td(OFF) PULSE WIDTH FIGURE RESISTIVE SWITCHING TEST CIRCUIT FIGURE RESISTIVE SWITCHING WAVEFORMS CHARGE FIGURE BASIC GATE CHARGE WAVEFORM ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 Screening Information Screening performed accordance with latest revision effect MIL-S-19500, (Screening Information Table). Delta Tests Limits (JANS) 25oC, Unless Otherwise Specified PARAMETER Gate Source Leakage Current Zero Gate Voltage Drain Current Drain Source Resistance Gate Threshold Voltage NOTES: 100% Initial Reading (whichever greater). Initial Reading. SYMBOL IGSS IDSS rDS(ON) VGS(TH) TEST CONDITIONS ±20V Rated Value 25oC Rated 1.0mA (Note (Note ±20% (Note ±20% (Note UNITS Screening Information TEST Gate Stress Pind Burn-In Tests (Note Steady State Gate Bias (Gate Stress) 30V, 250µs Required MIL-S-19500 Group Subgroup (All Static Tests 25oC) MIL-STD-750, Method 1042, Condition Rated Value, 150oC, Time hours Delta Parameters Listed Delta Tests Limits Table MIL-STD-750, Method 1042, Condition Rated Value, 150oC, Time hours MIL-S-19500, Group Subgroups JANS Interim Electrical Tests (Note Steady State Reverse Bias (Drain Stress) Final Electrical Tests (Note NOTE: Test limits identical post burn-in. Additional Screening Tests PARAMETER Safe Operating Area Unclamped Inductive Switching Thermal Response Thermal Impedance SYMBOL TEST CONDITIONS 200V, 10ms VGS(PEAK) 15V, 0.1mH 10ms; 25V; 500ms; 25V; 0.50 UNITS ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 Hard Data Packages Intersil Power Transistors JANS Hard Standard Data Package Certificate Compliance Serialization Records Assembly Flow Chart Photos Report Preconditioning Attributes Data Sheet Hi-Rel Traveler HTRB Temp Gate Stress Post Reverse Bias Data Delta Data HTRB Temp Drain Stress Post Reverse Bias Delta Data Group Group Group Group Attributes Data Sheet Attributes Data Sheet Attributes Data Sheet Attributes Data Sheet JANS Hard Optional Data Package Certificate Compliance Serialization Records Assembly Flow Chart Photos Report Preconditioning Attributes Data Sheet Hi-Rel Traveler HTRB Temp Gate Stress Post Reverse Bias Data Delta Data HTRB Temp Drain Stress Post Reverse Bias Delta Data X-Ray X-Ray Report Group Attributes Data Sheet Hi-Rel Traveler Subgroups Data Attributes Data Sheet Hi-Rel Traveler Subgroups Data Attributes Data Sheet Hi-Rel Traveler Subgroups Data Attributes Data Sheet Hi-Rel Traveler Post Radiation Data Group Group Group ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. JANSR2N7278 TO-205AF LEAD JEDEC TO-205AF HERMETIC METAL PACKAGE INCHES SYMBOL 0.160 0.016 0.350 0.315 0.095 0.190 0.095 0.010 0.028 0.029 0.500 0.075 0.180 0.021 0.370 0.335 0.105 0.210 0.105 0.020 0.034 0.045 0.560 MILLIMETERS 4.07 0.41 8.89 8.01 2.42 4.83 2.42 0.26 0.72 0.74 12.70 1.91 4.57 0.53 9.39 8.50 2.66 5.33 2.66 0.50 0.86 1.14 14.22 NOTES SEATING PLANE NOTES: These dimensions within allowable dimensions Rev. JEDEC TO-205AF outline dated 11-82. Lead dimension (without solder). Solder coating vary along lead length, typically 0.002 inches (0.05mm) solder coating. Position lead measured 0.100 inches (2.54mm) from bottom seating plane. This zone controlled automatic handling. variation actual diameter within this zone shall exceed 0.010 inches (0.254mm). Lead butt welded stem base. Controlling dimension: Inch. Revision dated 6-94. ©2001 Fairchild Semiconductor Corporation JANSR2N7278 Rev. TRADEMARKS following registered unregistered trademarks Fairchild Semiconductor owns authorized intended exhaustive list such trademarks. Quiet SeriesDISCLAIMER FAST PACMANPOPPowerTrench QFETQSQT OptoelectronicsQuiet SeriesSILENT SWITCHER SMART STARTStar* PowerStealth SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTinyLogicUHCUltraFET VCX FAIRCHILD SEMICONDUCTOR RESERVES RIGHT MAKE CHANGES WITHOUT FURTHER NOTICE PRODUCTS HEREIN IMPROVE RELIABILITY, FUNCTION DESIGN. FAIRCHILD DOES ASSUME LIABILITY ARISING APPLICATION PRODUCT CIRCUIT DESCRIBED HEREIN; NEITHER DOES CONVEY LICENSE UNDER PATENT RIGHTS, RIGHTS OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL FAIRCHILD SEMICONDUCTOR CORPORATION. used herein: Life support devices systems devices critical component component life support device system whose failure perform systems which, intended surgical implant into reasonably expected cause failure life body, support sustain life, whose support device system, affect safety failure perform when properly used accordance with instructions provided labeling, effectiveness. reasonably expected result significant injury user. PRODUCT STATUS DEFINITIONS Definition Terms Datasheet Identification Advance Information Product Status Formative Design Definition This datasheet contains design specifications product development. Specifications change manner without notice. This datasheet contains preliminary data, supplementary data will published later date. Fairchild Semiconductor reserves right make changes time without notice order improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves right make changes time without notice order improve design. Preliminary First Production Identification Needed Full Production Obsolete Production This datasheet contains specifications product that been discontinued Fairchild semiconductor. datasheet printed reference information only. Rev. Other recent searchesSi1904EDH - Si1904EDH Si1904EDH Datasheet RS232 - RS232 RS232 Datasheet MPC500 - MPC500 MPC500 Datasheet LED-301A - LED-301A LED-301A Datasheet EPC3089-X - EPC3089-X EPC3089-X Datasheet CDP1802AC - CDP1802AC CDP1802AC Datasheet 1N4448W - 1N4448W 1N4448W Datasheet
Privacy Policy | Disclaimer |