AM29818

Datasheets.org.uk - 100 Million Datasheets from 7500 Manufacturers.

Datasheet Thumbnail

Top Searches for this datasheet

AM29818 - AM29818

CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
Function, Pinout, Drive Compatible With FCT, Logic, AM29818 Reduced (Typically Version Equivalent Functions Edge-Rate Control Circuitry Significantly Improved Noise Characteristics Ioff Supports Partial-Power-Down Mode Operation Matched Rise Fall Times Fully Compatible With Input Output Logic Levels 8-Bit Pipeline Shadow Register Protection Exceeds JESD 2000-V Human-Body Model (A114-A) 200-V Machine Model (A115-A) 1000-V Charged-Device Model (C101) CY29FCT818CT 64-mA Output Sink Current 32-mA Output Source Current CY29FCT818ATDMB 20-mA Output Sink Current 3-mA Output Source Current 3-State Outputs
PACKAGE (TOP VIEW)
DCLK
MODE PCLK
description
CY29FCT818T contains high-speed 8-bit general-purpose data pipeline register high-speed 8-bit shadow register. general-purpose register used 8-bit-wide data path normal system application. shadow register designed applications such diagnostics sequential circuits, where desirable load known data specific location circuit read data that location. shadow register load data from output device, used right-shift register with bit-serial input (SDI) output (SDO), using DCLK. data register input multiplexed enable loading from shadow register from data input pins, using PCLK. Data loaded simultaneously from shadow register pipeline register, from pipeline register shadow register, provided setup-time hold-time requirements satisfied, with respect independent clock inputs. typical application, general-purpose register this device replaces 8-bit data register normal data path system. shadow register placed auxiliary bit-serial loop that used diagnostics. During diagnostic operation, data shifted serially into shadow register, then transferred general-purpose register load known value into data path. read contents that point data path, data transferred from data register into shadow register, then shifted serially auxiliary diagnostic loop make accessible diagnostics controller. This data then compared with expected value diagnose faulty operation sequential circuit. This device fully specified partial-power-down applications using Ioff. Ioff circuitry disables outputs, preventing damaging current backflow through device when powered down.
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet.
Copyright 2001, Texas Instruments Incorporated
products compliant MIL-PRF-38535, parameters tested unless otherwise noted. other products, production processing does necessarily include testing parameters.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
ORDERING INFORMATION
-40°C 85°C 40°C QSOP SOIC PACKAGE Tube Tape reel Tube Tape reel SPEED (ns) ORDERABLE PART NUMBER CY29FCT818CTPC CY29FCT818CTQCT CY29FCT818CTSOC CY29FCT818CTSOCT TOP-SIDE MARKING CY29FCT818CTPC 29FCT818C 29FCT818C
-55°C 125°C CDIP Tube CY29FCT818ATDMB Package drawings, standard packing quantities, thermal data, symbolization, design guidelines available www.ti.com/sc/package. FUNCTION TABLE INPUTS MODE DCLK PCLK OUTPUT SHADOW REGISTER S0SDI SiSi-1 SiYi Hold PIPELINE REGISTER PiDi OPERATION Serial shift; D7-D0 output disabled Load pipeline register from data input Load shadow register from output Hold shadow register; D7-D0 output enabled
PiSi Load pipeline register from shadow register High logic level, logic level, Don't care, Low-to-high transition, Transfer direction, applicable
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
logic diagram
DCLK 8-Bit Shadow Register D0-D7
S0-S7
MODE
PCLK
8-Bit Pipeline Register P0-P7
Y0-Y7
absolute maximum rating over operating free-air temperature range (unless otherwise noted)
Supply voltage range ground potential -0.5 input voltage range -0.5 output voltage range -0.5 output current (maximum sink current/pin) Package thermal impedance, (see Note package 67°C/W (see Note package 61°C/W (see Note package 46°C/W Ambient temperature range with power applied, -65°C 135°C Storage temperature range, Tstg -65°C 150_C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: package thermal impedance calculated accordance with JESD 51-3. package thermal impedance calculated accordance with JESD 51-7.
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
recommended operating conditions (see Note
CY29FCT818ATDMB Supply voltage High-level input voltage Low-level input voltage High-level output current Low-level output current Operating free-air temperature CY29FCT818T 4.75 5.25 UNIT
NOTE unused inputs device must held ensure proper device operation.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER 4.75 4.75 4.75 inputs 5.25 5.25 5.25 5.25 5.25 5.25 5.25 VOUT VOUT VOUT VOUT VOUT VOUT VOUT -120 -225 -120 -225 TEST CONDITIONS 0.55 0.55 CY29FCT818ATDMB -0.7 -1.2 -0.7 -1.2 CY29FCT818T UNIT
Vhys IOZH IOZL Ioff
Outputs open 5.25 Outputs open
Typical values 25°C. more than output should shorted time. Duration short should exceed second. high-speed test apparatus and/or sample-and-hold techniques preferable minimize internal chip heating more accurately reflect operational values. Otherwise, prolonged shorting high output raise chip temperature well above normal cause invalid readings other parametric tests. sequence parameter tests, tests should performed last. TTL-driven input (VIN other inputs
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) (continued)
PARAMETER TEST CONDITIONS Outputs open, input switching duty cycle, GND, 5.25 Outputs open, input switching duty cycle, GND, switching duty cycle Eight bits four controls switching duty cycle switching duty cycle Eight bits four controls switching duty cycle 17.8|| 30.8|| 17.8|| 30.8|| CY29FCT818ATDMB 0.25 0.25 CY29FCT818T UNIT
open Outputs MHz, 5.25 open Outputs MHz,
Typical values 25°C. This parameter derived total power-supply calculations. ICCD (f0/2 Where: Total supply current Power-supply current with CMOS input levels Power-supply current high input (VIN Duty cycle inputs high Number inputs ICCD Dynamic current caused input transition pair (HLH LHL) Clock frequency registered devices, otherwise zero Input signal frequency Number inputs changing currents milliamperes frequencies megahertz. Values these conditions examples formula.
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
timing requirements over recommended operating free-air temperature range (unless otherwise noted) (see Figure
PARAMETER Pulse width PCLK high DCLK high before PCLK MODE before PCLK before DCLK Setup time MODE before DCLK before DCLK DCLK before PCLK PCLK before DCLK after PCLK MODE after PCLK Hold time after DCLK MODE after DCLK after DCLK CY29FCT818AT CY29FCT818CT UNIT
switching characteristics over operating free-air temperature range (see Figure
PARAMETER FROM (INPUT) PCLK MODE DCLK tPZL tPZH tPLZ tPHZ DCLK DCLK DCLK DCLK (OUTPUT) CY29FCT818AT CY29FCT818CT UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS
PARAMETER MEASUREMENT INFORMATION
From Output Under Test (see Note Test Point From Output Under Test (see Note Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open
LOAD CIRCUIT TOTEM-POLE OUTPUTS
LOAD CIRCUIT 3-STATE OUTPUTS Timing Input Data Input VOLTAGE WAVEFORMS SETUP HOLD TIMES tPZL tPLH Output Waveform (see Note Output Waveform (see Note tPZH tPLZ tPHZ VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING
Input
VOLTAGE WAVEFORMS PULSE DURATION
Input tPLH In-Phase Output tPHL Out-of-Phase Output
tPHL
Output Control
VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS
NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. outputs measured time with input transition measurement.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments Incorporated subsidiaries (TI) reserve right make corrections, modifications, enhancements, improvements, other changes products services time discontinue product service without notice. Customers should obtain latest relevant information before placing orders should verify that such information current complete. products sold subject TI's terms conditions sale supplied time order acknowledgment. warrants performance hardware products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques used extent deems necessary support this warranty. Except where mandated government requirements, testing parameters each product necessarily performed. assumes liability applications assistance customer product design. Customers responsible their products applications using components. minimize risks associated with customer products applications, customers should provide adequate design operating safeguards. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right relating combination, machine, process which products services used. Information published regarding third-party products services does constitute license from such products services warranty endorsement thereof. such information require license from third party under patents other intellectual property third party, license from under patents other intellectual property Reproduction information data books data sheets permissible only reproduction without alteration accompanied associated warranties, conditions, limitations, notices. Reproduction this information with alteration unfair deceptive business practice. responsible liable such altered documentation. Resale products services with statements different from beyond parameters stated that product service voids express implied warranties associated product service unfair deceptive business practice. responsible liable such statements.
Mailing Address: Texas Instruments Post Office 655303 Dallas, Texas 75265
Copyright 2001, Texas Instruments Incorporated

AM29818

Top Searches for this datasheet

Other recent searches